Proton radiation damage in high-resistivity n-type silicon CCDs

  • Christopher Bebek, Donald E. Groom, Steven E. Holland, Armin Karcher, William F. Kolbe, Julie S. Lee, Michael E. Levi, Nicholas P. Palaio, Bojan T. Turko, Michela C. Uslenghi, M. T. Wagner, Guobin Wang
  • April 2002, SPIE
  • DOI: 10.1117/12.463422

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http://dx.doi.org/10.1117/12.463422

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