What is it about?
We show how polarized light from laser can be used to probe anisotropy in materials. We employ a novel microscopy technique, where imaging lens is replaced by iterative algorithm, to map the index of refraction and dielectric permittivity in optically anisotropic materials with purely diffraction limited resolution.
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Why is it important?
Optically anisotropic materials are being actively studied recently in search for novel information and storage devices. The deep new physics can be revealed when access to more information on the samples is available for researchers. The results of this paper show new contrast modality for lensless imaging using polarized light, making possible new studies of the anisotropic materials.
Perspectives
The technique can be seamlessly extended to x-ray frequencies at third generation synchrotron storage rings as well as free electron lasers to probe magnetic and electric systems at nanoscale with high penetrability of x-ray radiation at femtosecond temporal resolution. At optical frequencies various soft matter systems can benefit from this contrast modality in lensless imaging, especially life cell imaging without compromising the sample integrity since using our approach it is possible to avoid staining.
Mr Dmitry Karpov
New Mexico State University
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Birefringent coherent diffraction imaging
, November 2016, SPIE,
DOI: 10.1117/12.2235865.
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