Surface Correlation Function Analysis Of High Resolution Scattering Data From Mirrored Surfaces Obtained Using A Triple-Axis X-Ray Diffractometer

Finn E. Christensen, A. Hornstrup, Herbert W. Schnopper
  • August 1988, SPIE
  • DOI: 10.1117/12.942161

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http://dx.doi.org/10.1117/12.942161