Raman Scattering From Rapid Thermally Annealed Tungsten Silicide Thin Films

Howard E. Jackson, Joseph T. Boyd, U. Ramabadran, R. Vuppuladhadium
  • January 1988, SPIE
  • DOI: 10.1117/12.941943

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http://dx.doi.org/10.1117/12.941943