Ellipsometric Study Of ZnO/Ag/ZnO Optical Coatings: Determination Of Layer Thicknesses And Optical Constants

K. Memarzadeh, J. A. Woollam, A. Belkind
  • November 1987, SPIE
  • DOI: 10.1117/12.941868

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http://dx.doi.org/10.1117/12.941868