Microstructure Modeling: Scattering And Form Birefringence In Dielectric Thin Films

J. K. Moyle, W. J. Gunning III, W. H. Southwell
  • February 1988, SPIE
  • DOI: 10.1117/12.941853

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1117/12.941853