Influence Of Density Of States Distribution And Trapping Rates On The Transient Response In Amorphous Semiconductors

G. J. Adriaenssens, G. Seynhaeve, H. Michiel
  • August 1987, SPIE
  • DOI: 10.1117/12.940162

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http://dx.doi.org/10.1117/12.940162