Use Of Fringe Scanning Method In Electron Holographic Interferometry

Toyohiko Yatagai, Katsuyuki Ohmura, Shigeo Iwasaki, Akira Tonomura, Junji Endo, Shuji Hasegawa
  • January 1988, SPIE
  • DOI: 10.1117/12.939026

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http://dx.doi.org/10.1117/12.939026