Developments In Image Processing For Industrial Inspection

B. G. Batchelor, C. C. Bowman, K. W. Chow, S. J. Goodman, D. E. Kelly, A. J. McCollum, S. M. Rowland
  • May 1987, SPIE
  • DOI: 10.1117/12.937855

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1117/12.937855