Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6    μ m and shearography at 532 nm

Fabian Languy, Jean-François Vandenrijt, Cédric Thizy, Jonathan Rochet, Christophe Loffet, Daniel Simon, Marc P. Georges
  • Optical Engineering, June 2016, SPIE
  • DOI: 10.1117/1.oe.55.12.121704

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1117/1.oe.55.12.121704