Characterization of the Si/SiO2 interface morphology from quantum oscillations in Fowler–Nordheim tunneling currents

  • J. C. Poler
  • Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena, January 1994, American Vacuum Society
  • DOI: 10.1116/1.587113

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http://dx.doi.org/10.1116/1.587113

The following have contributed to this page: Jordan Poler