Publication not explained
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
Featured Image
Read the Original
This page is a summary of: Robust dielectric properties of B-site size-disordered hexagonal Ln2CuTiO6 (Ln = Y, Dy, Ho, Er, and Yb), Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, May 2014, American Vacuum Society,
DOI: 10.1116/1.4868112.
You can read the full text:
Contributors
The following have contributed to this page
