In-Line Characterization of Micro-Droplets Based on Partial Light Reflection at the Solid-Liquid Interface

Emanuel Weber, Dietmar Puchberger-Enengl, Michael J. Vellekoop
  • July 2012, ASME International
  • DOI: 10.1115/icnmm2012-73155

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http://dx.doi.org/10.1115/icnmm2012-73155

The following have contributed to this page: Dietmar Puchberger-Enengl