Comparison of Electronic Component Durability Under Uniaxial and Multiaxial Random Vibrations

Matthew Ernst, Ed Habtour, Abhijit Dasgupta, Michael Pohland, Mark Robeson, Mark Paulus
  • Journal of Electronic Packaging, October 2014, ASME International
  • DOI: 10.1115/1.4028516

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http://dx.doi.org/10.1115/1.4028516

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