Publication not explained
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
Featured Image
Read the Original
This page is a summary of: Linear least-squares fit evaluation of series of analytical spectra from planar defects: extension and possible implementations in scanning transmission electron microscopy, Journal of Microscopy, August 2006, Wiley,
DOI: 10.1111/j.1365-2818.2006.01608.x.
You can read the full text:
Contributors
The following have contributed to this page
