Full-field strain mapping by optical correlation of micrographs acquired during deformation

J. QUINTA DA FONSECA, P. M. MUMMERY, P. J. WITHERS
  • Journal of Microscopy, April 2005, Wiley
  • DOI: 10.1111/j.1365-2818.2005.01461.x

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http://dx.doi.org/10.1111/j.1365-2818.2005.01461.x

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