An easy and versatile embedding method for transverse sections

  • I. De Smet, P. Chaerle, S. Vanneste, R. De Rycke, D. Inze, T. Beeckman
  • Journal of Microscopy, January 2004, Wiley
  • DOI: 10.1111/j.1365-2818.2004.01269.x

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http://dx.doi.org/10.1111/j.1365-2818.2004.01269.x

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