What is it about?
An approach to explore deep crustal structures from short-offset profiles
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Why is it important?
In the absence of long distance refraction profiles, this approach provides clues on the plausible deep structure in the region
Perspectives
The results can be supported with the available coincident deep reflection data in the region
Krishna V.G. Dr.
Read the Original
This page is a summary of: Processing and modelling of short-offset seismic refraction-coincident deep seismic reflection data sets in sedimentary basins: an approach for exploring the underlying deep crustal structures, Geophysical Journal International, December 2005, Oxford University Press (OUP),
DOI: 10.1111/j.1365-246x.2005.02792.x.
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