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This page is a summary of: Spectroscopic detection of (i) intrinsic band edge defects, and (ii) transition metal (TM) and rare earth lanthanide (REL) atom occupied states in elemental and complex oxides: A novel pathway to (i) device reliability and (ii) increased functionality ..., March 2009, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/ulis.2009.4897547.
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