Sequential Test for Reliability Under Allowance for Target Uncertainty

Y. H. Michlin, D. Ingman, Lilach Levin-David
  • IEEE Transactions on Reliability, December 2012, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tr.2012.2220911

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http://dx.doi.org/10.1109/tr.2012.2220911

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