Goodness-of-Fit Test Based on Kullback-Leibler Information for Progressively Type-II Censored Data

Arezou Habibi Rad, Fatemeh Yousefzadeh, Narayanaswamy Balakrishnan
  • IEEE Transactions on Reliability, September 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tr.2011.2162470

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http://dx.doi.org/10.1109/tr.2011.2162470

The following have contributed to this page: Fatemeh Yousefzadeh