Improvement on “Sequential Testing” in MIL-HDBK-781A and IEC 61124

Y.H. Michlin, L. Meshkov, I. Grunin
  • IEEE Transactions on Reliability, June 2008, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tr.2008.916886

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http://dx.doi.org/10.1109/tr.2008.916886

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