Integrated Testing and Algorithms for Visual Inspection of Integrated Circuits

  • L. F. Pau
  • IEEE Transactions on Pattern Analysis and Machine Intelligence, November 1983, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tpami.1983.4767449

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http://dx.doi.org/10.1109/tpami.1983.4767449

The following have contributed to this page: Professor Louis F Pau

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