Measurement of lateral charge diffusion in thick, fully depleted, back-illuminated CCDs

  • A. Karcher, C.J. Bebek, W.F. Kolbe, D. Maurath, V. Prasad, M. Uslenghi, M. Wagner
  • IEEE Transactions on Nuclear Science, October 2004, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tns.2004.834721

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http://dx.doi.org/10.1109/tns.2004.834721

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