Proton radiation damage in p-channel CCDs fabricated on high-resistivity silicon

  • C. Bebek, D. Groom, S. Holland, A. Karcher, W. Kolbe, J. Lee, M. Levi, N. Palaio, B. Turko, M. Uslenghi, A. Wagner, G. Wang
  • IEEE Transactions on Nuclear Science, June 2002, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tns.2002.1039641

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http://dx.doi.org/10.1109/tns.2002.1039641

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