Data analysis of the extraction of dielectric properties from insulating substrates utilizing the evanescent perturbation method

R. Inoue, Y. Odate, E. Tanabe, H. Kitano, A. Maeda
  • IEEE Transactions on Microwave Theory and Techniques, February 2006, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tmtt.2005.862707

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Dr Ryotaro Inoue