Field-Emission Breakdown and Electromigration in Insulated Planar Nanoscopic Contacts

Alessandro Bramanti, Giuseppe Maruccio, Paolo Visconti, Stefano D'Amico, Roberto Cingolani, Ross Rinaldi
  • IEEE Transactions on Electron Devices, December 2006, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ted.2006.885659

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The following have contributed to this page: Giuseppe Maruccio