Comparison and combination of imaging techniques for three dimensional analysis of electrical trees

Roger Schurch, Simon Rowland, Robert Bradley, Philip Withers
  • IEEE Transactions on Dielectrics and Electrical Insulation, April 2015, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tdei.2015.7076766

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http://dx.doi.org/10.1109/tdei.2015.7076766

The following have contributed to this page: Professor Philip J Withers