Imaging and analysis techniques for electrical trees using X-ray computed tomography

Roger Schurch, Simon Rowland, Robert Bradley, Philip Withers
  • IEEE Transactions on Dielectrics and Electrical Insulation, February 2014, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tdei.2014.6740725

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http://dx.doi.org/10.1109/tdei.2014.6740725

The following have contributed to this page: Professor Philip J Withers