Fault location and diagnosis in a medium voltage EPR power cable

A. J. Reid, C. Zhou, D. M. Hepburn, M. D. Judd, W. H. Siew, P. Withers
  • IEEE Transactions on Dielectrics and Electrical Insulation, February 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tdei.2013.6451336

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Professor Philip J Withers