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This page is a summary of: Analysis of Back-Gate Bias Control on EVM Measurements of a Dual-Band Power Amplifier in 22 nm FD-SOI for 5G 28 and 39 GHz Applications, IEEE Transactions on Circuits and Systems I Regular Papers, February 2025, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/tcsi.2024.3487636.
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