Physics of failure for portable electronic devices in military applications

E. Habtour, B. Werner, A. Hilburn, H. I. Saraidaridis
  • January 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/rams.2013.6517620

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http://dx.doi.org/10.1109/rams.2013.6517620

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