What is it about?

The study aimed to validate the "Kessler Psychological Distress Scale (K-10)" within the Indian context. The investigation involved administering the K10 to a community sample of 679 undergraduate students, comprising 473 females (67.12%) and 206 males (32.86%), aged 19 to 22 years, from diverse government and private colleges/universities. The sample was divided into two sets: the first set of 340 students was subjected to an "Exploratory Factor Analysis" while the second set of 339 students underwent a "Confirmatory Factor Analysis". The model's fit to the observed data was evaluated using maximum likelihood estimation techniques. Additionally, Cronbach's alpha was computed to assess the scale's internal consistency. The results affirmed the validity and reliability of the "K-10 Psychological Distress Scale" for measuring psychological distress among Indian undergraduate students.

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Why is it important?

A comprehensive review of the literature highlights the scarcity of sufficient validation research focusing specifically on the psychological distress of undergraduate students in India using the K-10 scale. Hence, there is a crucial need to bridge this gap by validating the "Kessler Psychological Distress Scale (K-10)" within the Indian context, particularly emphasizing undergraduate students. Such validation endeavors will offer essential insights into the K-10's applicability and accuracy within this specific milieu, enabling a more dependable and culturally pertinent assessment of psychological distress among Indian college students.

Perspectives

Writing this article has been an enriching experience, particularly because it's a vital part of our research project. The findings from this study are expected to be a valuable asset for researchers exploring psychological distress among higher education students in the Indian context.

jyoti gupta
Lovely Professional University

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This page is a summary of: Analysis of Psychometric Properties of Kessler Psychological Distress Scale (K-10) in the Indian Context, October 2023, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/r10-htc57504.2023.10461841.
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