A critical review on the methods for calculating the risk of process failure because of voltage sags

  • Subir Majumder, S. A. Khaparde, Vedanta Pradhan, S. V. Kulkarni, Ashish P. Agalgaonkar, Sarath Perera, Phil Ciufo
  • September 2016, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/powercon.2016.7754042

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http://dx.doi.org/10.1109/powercon.2016.7754042

The following have contributed to this page: Dr Philip Ciufo

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