What is it about?
Research in noise measurement in nanocomposite thin films on silicon
Featured Image
Why is it important?
New findings in low frequency noise characterization
Perspectives
The findings of this research were presented at the IEEE NANO 2010 held in South Korea.
Dr Syed A Malik
Universiti Pendidikan Sultan Idris
Read the Original
This page is a summary of: Low-frequency electrical noise in nanocomposite material on silicon, August 2010, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/nano.2010.5697769.
You can read the full text:
Contributors
The following have contributed to this page
