What is it about?
This paper presents a transimpedance amplifier (TIA) which was optimized for detecting very weak signals generated for microscopy imaging in the scanning electron microscope (SEM).
Featured Image
Photo by Magnus Engø on Unsplash
Why is it important?
The circuit, connected to an integrated photodiode with a junction capacitance of 10 pF, exhibited a transimpedance gain of 107.3 dB, a bandwidth of 12.5 MHz, an input-referred noise of 3.54 × 10−12A/√Hz, and an SNR of 8, which manifested that the design is suitable for integration into a multipixel CMOS photon detector to perform intelligent sensing of secondary electrons in the SEM.
Perspectives
A good TIA design for ultra small input signal.
Dr Joon Huang Chuah
University of Malaya
Read the Original
This page is a summary of: Design of Low-Noise High-Gain CMOS Transimpedance Amplifier for Intelligent Sensing of Secondary Electrons, IEEE Sensors Journal, October 2015, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/jsen.2015.2452934.
You can read the full text:
Resources
Contributors
The following have contributed to this page
