An improved interconnect noise methodology for reduced pessimism using dAP model

Wong Wai Mun, Arjuna Bin Marzuki, Wong Yew Honn
  • September 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/isiea.2011.6108717

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http://dx.doi.org/10.1109/isiea.2011.6108717

The following have contributed to this page: Dr Arjuna Bin Marzuki