Reducing short channel effects in dual gate SOI-MOSFETs with a drain dependent gate bias

Mohsen Khani Parashkoh, Seyed Ebrahim Hosseini, Iman Abaspur Kazerouni
  • May 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iraniancee.2010.5507042

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http://dx.doi.org/10.1109/iraniancee.2010.5507042

The following have contributed to this page: Iman Abaspur Kazerouni