A case study on the relation between electroencephalographic and electrocorticographic event-related potentials

D J Krusienski, J J Shih
  • August 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iembs.2010.5627603

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1109/iembs.2010.5627603

The following have contributed to this page: Dean Krusienski