Factors affecting product quality and reliability: A comparison of developed and developing countries

Pei-Lee Teh, Dotun Adebanjo, Pervaiz K. Ahmed
  • December 2014, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ieem.2014.7058885

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http://dx.doi.org/10.1109/ieem.2014.7058885

The following have contributed to this page: Professor Dotun Adebanjo