The effect of thermal treatment on the electrical properties of MBE-AlInAs

J.K. Luo, H. Thomas, S.A. Clark, R.H. Williams
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iciprm.1994.328245

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http://dx.doi.org/10.1109/iciprm.1994.328245

The following have contributed to this page: Jack Luo (Jikui Luo)