Effect of growth condition on electrical properties of MBE and MOCVD-AlInAs

J.K. Luo, H. Thomas
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iciprm.1993.380681

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Jack Luo (Jikui Luo)