Electrical characterization of 1 MeV electron irradiated ITO/InP structures

J.K. Luo, H. Thomas, N.M. Pearsall
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iciprm.1992.235618

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The following have contributed to this page: Jack Luo (Jikui Luo)