Electrical characterization of 1 MeV electron irradiated ITO/InP structures

J.K. Luo, H. Thomas, N.M. Pearsall
  • Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iciprm.1992.235618

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1109/iciprm.1992.235618

The following have contributed to this page: Jack Luo (Jikui Luo)