Transmission-Mode Scanning Probe Laser Terahertz Emission Microscope

N. Uchida, R. Inoue, I. Kawayama, H. Murakami, M. Tonouchi
  • September 2006, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icimw.2006.368793

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http://dx.doi.org/10.1109/icimw.2006.368793

The following have contributed to this page: Dr Ryotaro Inoue