Impact of assessment period on voltage THD measurements

  • Sean Elphick, Vic Smith, Phil Ciufo, Gerrard Drury
  • October 2016, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ichqp.2016.7783337

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http://dx.doi.org/10.1109/ichqp.2016.7783337

The following have contributed to this page: Dr Philip Ciufo

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