Lifetime analysis of aluminum electrolytic capacitor subject to voltage fluctuations

  • Kun Zhao, Philip Ciufo, Sarath Perera
  • September 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ichqp.2010.5625486

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http://dx.doi.org/10.1109/ichqp.2010.5625486

The following have contributed to this page: Dr Philip Ciufo

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