Outlier detection from ETL execution trace

Samiran Ghosh, Saptarsi Goswami, Amlan Chakrabarti
  • April 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icectech.2011.5942112

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http://dx.doi.org/10.1109/icectech.2011.5942112

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