Hardware attack risk assessment

Samer Moein, Fayez Gebali, T. Aaron Gulliver, M. Watheq El-Kharashi
  • December 2015, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icces.2015.7393073

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http://dx.doi.org/10.1109/icces.2015.7393073

The following have contributed to this page: Professor T. Aaron Gulliver