Ultrasonic Time of Flight Diffraction Defect Recognition Based on Edge Detection

Yuwen Cao, Haijiang Zhu, Ping Yang
  • April 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/icbecs.2010.5462463

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http://dx.doi.org/10.1109/icbecs.2010.5462463

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