Transmission and reflection mode scanning microwave microscopy (SMM): Experiments, calibration, and simulations

Pablo F. Medina, Andrea Lucibello, Georg Gramse, Enrico Brinciotti, Manuel Kasper, A.O. Oladipo, Reinhard Feger, Andreas Stelzer, Hassan Tanbakuchi, Roger Stancliff, Emanuela Proietti, Romolo Marcelli, Ferry Kienberger
  • September 2015, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/eumc.2015.7345848

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http://dx.doi.org/10.1109/eumc.2015.7345848

The following have contributed to this page: Dr Romolo Marcelli